TISKEN VEGA tungsten filament scanning electron microscope

TISKEN VEGA tungsten filament scanning electron microscopeAdopting a brand new Essence ™ The electron microscope control software system integrates scanning morphology images and real-time element analysis into the same scanning window. This combination greatly simplifies the collection of sample surface morphology and analysis of elemental data, making the new fourth generation VEGA SEM a more efficient analytical solution for quality control, fault analysis, and testing of conventional materials in research laboratories.

Outstanding features

Fully integrated TESCAN Essence ™ EDS analysis platform, in Essence ™ SEM imaging and elemental composition analysis can be achieved within a single window of the electron microscopy control software.

TESCAN adopts a unique non mechanical aperture design and utilizes real-time electron beam tracking (In Flight Beam Tracing) ™） The technology can help users quickly obtain electron microscopyImaging and analysis conditions.

Unique Wide Field Optics ™） Designed with a minimum magnification of 2 times, SEM navigation can be easily achieved without the need for additional optical navigation cameras.

SingleVac ™ As a standard configuration, the mode provides a convenient analytical tool for observing non-conductive samples and electron beam sensitive samples.

Real time stereoscopic imaging can be obtained using 3D beam technology.

During the sample movement of the sample stage and device, Essence ™ The 3D anti-collision module can intuitively display the position information of detectors and sample tables installed in the chamber, providingProtection of security.

The vacuum buffering energy-saving unit can significantly shorten the operating time of mechanical pumps and provide an environmentally friendly and economically efficient electron microscope.

Modular analysis platform, with the option to integrate the widest range of detectors and accessories (such as cathode fluorescence detectors, water-cooled backscattered electron detectors, or Raman spectrometers).